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Intellectual leverage for the information society : digest of papers, Compcon Spring 83, Twenty-sixth IEEE Computer Society International Conference, Cathedral Hill Hotel (formerly Jack Tar), San Francisco, California, February 28-March 3

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索取号:TP3-53/E9033/26
作者:Compcon (26th : 1983 : San Francisco、 Calif.)、IEEE Computer Society.、
出版社:New York, NY : IEEE Computer Society ; Los Angeles, CA : Available from IEEE Computer Society ; Piscataway, NJ : Available from IEEE Service Center, 1984,c1983.

High technology in the information industry : digest of papers, Compcon Spring 82, Twenty-fourth IEEE Computer Society International Conference, Jack Tar Hotel, San Francisco, California, February 22-25

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索取号:TP3-53/E9036/24
作者:Compcon (24th : 1982 : San Francisco、 Calif.)、IEEE Computer Society.、
出版社:New York, NY : Institute of Electrical and Electronics Engineers ; Los Alamitos, CA : Available from IEEE Computer Society ; Piscataway, NJ : Available from IEEE Service Center, 1982.

Proceedings

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索取号:TP3-53/E801/4
作者:International Conference on Distributed Computing Systems (4th : 1984 : San Francisco、 Calif.)、IEEE Computer Society.、
出版社:N.Y. Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1984.

Proceedings

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索取号:TP3-53/E801/1
作者:International Conference on Distributed Computing Systems (1st : 1979 : Huntsville、 Ala.)、United States. Army Ballistic Missile Defense Advanced Technology Center.、
出版社:New York : Institute of Electrical and Electronics Engineers, 1979.

Proceedings

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索取号:TP3-53/E9014/1
作者:International Conference on Computer Workstations (1st : 1985 : San Jose、 Calif.)、IEEE Computer Society.、
出版社:Washington, D.C. : IEEE Computer Society Press ; Los Angeles, Calif. : Order from IEEE Computer Society, 1985.

International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venue Metropole Convention Centre, Brighton

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索取号:TP274-53/E801/1977
作者:International Conference on New Developments in Automatic Testing、 Brighton、 Eng.、 1977.、Institution of Electrical Engineers. Control and Automation Division.、Institution of Electrical Engineers. Electronics Division.、
出版社:London : The Institution, 1977.

Multivariable control system design and applications : [proceedings of a conference held] 1-3 September 1971, [at the] University of Manchester, Owens Park

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索取号:TP273-53/E808
作者:UKAC Control Convention、 4th、 University of Manchester、 1971.、United Kingdom Automation Council.、Institution of Electrical Engineers.、University of Manchester.、
出版社:London, Institution of Electrical Engineers, 1971.

Adaptive systems in control and signal processing 1983 : proceedings of the IFAC workshop, San Franciso, USA, 20-22 June, 1983

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索取号:TP273-53/E903
作者:
出版社:Oxford [Oxfordshire] ; New York : Published for the International Federation of Automatic Control by Pergamon Press, 1983,c1984.

Proceedings

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索取号:TP252-53/E901/1986.3
作者:IEEE International Conference on Robotics and Automation (1986 : San Francisco、 Calif.)、IEEE Robotics and Automation Council.、IEEE Computer Society.、
出版社:Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1986.

Proceedings

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索取号:TP252-53/E901/1986.2
作者:IEEE International Conference on Robotics and Automation (1986 : San Francisco、 Calif.)、IEEE Robotics and Automation Council.、IEEE Computer Society.、
出版社:Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1986.

Proceedings

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索取号:TP252-53/E901/1986.1
作者:IEEE International Conference on Robotics and Automation (1986 : San Francisco、 Calif.)、IEEE Robotics and Automation Council.、IEEE Computer Society.、
出版社:Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1986.

Autotestcon '85, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing

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索取号:TP216-53/E901/1985
作者:IEEE International Automatic Testing Conference (1985 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、
出版社:New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, 1985.47,c1983.

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983

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索取号:TP216-53/E902/1983
作者:
出版社:N.J. Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, 1983.

Autotestcon '82, October 12-14 : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio

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索取号:TP216-53/E901/1982
作者:IEEE International Automatic Testing Conference (1982 : Dayton、 Ohio)、Institute of Electrical and Electronic Engineers.、
出版社:New York, N.Y. (345 E. 47th St., New York 10017) : IEEE, c1982.

Autotestcon '83, November 1,2,3, Hyatt Regency, Tarrant County Convention Center, Fort Worth, Texas new horizons in automatic testing

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索取号:TP216-53/E901/1983
作者:Autotestcon '83 (1983 : Fort Worth、 Tex.)、Institute of Electrical and Electronics Engineers.、
出版社:New York, NY : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Copies from Order Dept., IEEE, c1983.

Proceedings of the 1980 Joint Automatic Control Conference : an ASME Century 2 Emerging Technology Conference, August 13-15, San Francisco, California

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索取号:TP13-53/E801
作者:Joint Automatic Control Conference、 San Francisco、 1980.、American Society of Mechanical Engineers.、American Institute of Chemical Engineers.、American Institute of Aeronautics and Astronautics.、Society of Manufacturing Engineers.、American Automatic Control Council.、
出版社:[New York] : Published on behalf of the American Automatic Control Council [by the American Society of Mechanical Engineers], 1980.
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